
February
2005
February 2005
Capillary for Gas Chromatography:
Examination of Internal Diameter
By Joe Macomber
and Pete Nico
As printed in LCGC, The APPLICATION NOTEBOOK -- February
2005, Page 55 On the Web:
www.chromatographyonline.com/lcgc
Gas Chromatography column manufacturers
rely on synthetic fused silica capillary tubing as the substrate for
many of their column products. This application note examines the
dimensional control of key parameters within a single production run of
capillary tubing.
Introduction
Gas Chromatography has seen a long list
of advances through its history. Improvements in the capillary
substrate itself have been numerous; they include increased product
durability, longer spool lengths, and higher purity raw materials.
Notable improvements in product specifications have also been
realized, with dimensional tolerances growing increasingly tighter
over the material’s 25-year history. The end result of these many
advancements is production of more reliable, reproducible GC columns.
A previous study investigated the
dimensional control of GC capillary products from a statistical
perspective. End of spool measurements from several months’ worth of
production were analyzed and the results summarized.1 In a
continuing effort to better define existing capabilities, a single
production run has been closely examined and the results are discussed
below.
Experimental
Synthetic fused silica capillary tubing
product TSP320450 (0.32mm ID) was used in this study. Product
specifications are: ID 320 ± 6µm, OD 435 ± 10µm. Tubing was drawn
from a standard preform and produced using normal draw operating
parameters. The production run, totaling ~9000m, was cut
approximately every 200m and end samples collected for measurement (Data
Set A). One 200m section
was further segmented and end measurement samples taken every 10 m
(Data Set B). Finally, a 10m section, from within the 200m
segment, was cut every 0.5m and samples collected for measurement (Data
Set C).
Individual samples
were measured using a Pinnacle Vision System. The system was
outfitted with a 20X lens and then calibrated using a circular target
which was independently certified to an accuracy of < 0.5µm. A gauge
R&R study of a single piece measured a minimum of 30 times indicated
an expected error of 1.2µm (6-sigma) for this method.
Collected samples
were cleaved using Polymicro’s semi-auto cleaver. The polyimide was
removed from the tip of each cleaved sample so the Vision system
lighting allowed for the most accurate measurement of ID. ID was
based on the best-fit circle using a minimum of 50 annular data
points.
Results
Figure 1 summarizes
the findings of this study. The first data point, labeled “Spec.”,
indicates the current ID specification for TSP320450, with the error
bar representing the tolerance. Chart labels A, B, & C represent the
data sets described earlier, with the error bars indicating the
standard deviation. Data Set A had an average ID value of 322.6µm
with a standard deviation of 1.37µm. Data Sets B & C had average ID
values of 321.7µm & 321.1µm, respectively and corresponding standard
deviations of 0.85µm & 0.31µm.
This data suggests
that there are only sub-micron variations in the capillary ID over
typical GC column lengths. Further, the data shows that during a
typical draw the actual range of capillary ID produced spans only part
of the tolerance range. The ID range over the complete draw was less
than 7µm.

Figure 1:
Summary of average ID by Data Set. Spec. = Product
Specification and Tolerance, A = Data Set A (322.6µm, σ
1.37µm), B = Data Set B (321.7µm, σ 0.85µm), C = Data
Set C (321.1µm, σ 0.31µm). Error bars on Data Sets indicate
Standard Deviation. |
Conclusion
The data above
shows excellent stability of capillary ID over the course of a typical
production run of 0.32mm ID GC capillary. Additional data related to
ovality and concentricity will be presented in a future note as part
of Polymicro’s ongoing commitment to advancements in capillary
manufacturing.
References
(1) J. Macomber, P. Nico, & G. Nelson,
LCGC Applications Notebook, Feb. 2004, p. 66.
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